We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Probe Tester.
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Probe Tester Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Probe Tester Product List

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Dual Side Flying Probe Tester: APT-1600FD

This is a flagship model that arranges probe heads on both the top and bottom, enabling simultaneous in-circuit testing of the front and back of the substrate.

Four probes are arranged on the top side of the substrate and two on the bottom side. Each probe can move freely and at high speed, achieving an astonishing inspection speed that is world-class in its category. By using the flying probes on both the top and bottom simultaneously, a combination inspection with up to six probes allows for simultaneous contact inspection at both points on the top and bottom sides of the substrate. This significantly expands the inspection range and further accelerates inspection time. It is equipped with a wealth of features and boasts world-class standards in speed and positioning accuracy. ★ You can bring your substrate to our demo room at our Okayama headquarters for evaluation testing ★ We can conduct a series of tests including the creation of inspection programs, inspections using actual substrates, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below.

  • Circuit Board Inspection Equipment

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Dual Side Flying Probe Tester APT-1600FD-SL

The probe head is arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)

The simultaneous use of upper and lower flying probes enables a combination inspection of up to 6 probes, allowing for the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing your substrates to the demo room at our Okayama headquarters★ The entire process from creating inspection programs, inspecting using actual substrates, to summarizing evaluation results can be tested in a single flow. If you are interested, please apply through the 'Contact Us' section below.

  • Circuit Board Inspection Equipment

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The fastest in-circuit test! What are the features of a flying probe tester?

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing.

The Takaya APT series is a flying probe in-circuit tester that boasts overwhelming performance with the world's top market share, capable of detecting all defects on printed circuit boards through ultra-fast inspection. An in-circuit tester is a device that inspects the reliability of electrical connections between components and the board. By applying signals smaller than the operating current, it can identify defective areas and detect incorrect constants without damaging the components or the board. It is characterized by its ability to discover electrical defects that cannot be found through visual inspection (AOI), thereby enhancing quality assurance levels and making it easier to gain customer trust. The latest APT series has achieved a probe movement speed increase of up to 1.5 times compared to previous models, thanks to improvements in high-speed drive motors and communication control, enabling high-speed inspections with a minimum step of 0.02 seconds. This reduces inspection time by more than 30% compared to previous models, contributing to further reductions in inspection costs. Trial/testing consultations are also available. If you have any issues with inspecting printed circuit boards, please feel free to contact us. *For detailed information, please refer to the catalog.*

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  • Circuit Board Inspection Equipment

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[Case Study] Replacement of Fixture-type In-Circuit Tester

No need for jig creation, reducing running costs by over 90%!

We would like to introduce a case where a flying probe tester was implemented as a replacement for a fixture-type (press-type) tester. *Challenges - In the case of high-density mounted boards, there were components that could not be inspected with a fixture-type tester due to the difficulty of creating fixtures in narrow areas. - For low-volume production, such as maintenance parts after mass production, the cost of fixtures became high, increasing the overall cost burden, including maintenance. - There was a need to secure storage space for fixtures, which also added management hassle. *Implementation Effects - Components with narrow pitch that could not be inspected with fixtures can now be tested, enhancing reliability. - The need for fixture production has been eliminated, and there are no longer any running costs associated with maintenance. - Storage space for fixtures is no longer required, eliminating management hassle. For more details about the flying probe tester, please download the PDF catalog or feel free to contact us.

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Are you having trouble with automatic LED light emission inspection?

Measure the emission color/brightness of LEDs quantitatively with a unique color sensor!! 【LED Color Test System】

Are you struggling with the labor involved in inspecting the LED's emission color and brightness? Takahashi's flying probe tester has an optional feature that allows for the measurement of LED emission color and brightness using a color sensor. We have examples of cases where visual inspections have been switched to inspections using the flying probe tester. Here are the actual benefits of implementation: 1: Zero burden on visual inspectors Directly looking at the LED's emission color can damage the operator's eyes, but switching to the flying probe tester can eliminate this burden. 2: Clarification of measurement standards Visual inspection can lead to variability in judgment criteria among inspectors. However, inspections using a color sensor have clear judgment criteria based on numerical comparisons, allowing for stable inspections. 3: No need for jig manufacturing costs In the case of LED inspections with the flying probe tester, there is no need to create dedicated jigs. We welcome inquiries for trials and tests. If you have any concerns, please feel free to contact us.

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Leave the introduction of flying probe testers to overseas markets to us!!

Implemented in over 46 countries!! Takaya's tester is recognized worldwide.

Introducing Flying Probe Testers to overseas bases / Please leave the local setup to Takaya. Takaya has entered into a distributor agreement with Itochu Corporation for overseas sales, establishing sales/service bases in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. Please make use of Takaya's Flying Probe Testers, recognized not only in Japan but also by companies and industries around the world. *For more detailed information, please refer to the related link page below.

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Introducing the history of Takaya Flying Probe Testers that are active around the world.

Implemented in numerous global EMS companies and manufacturers in over 46 countries!!

Takaya is a leading company in the PCB inspection machine industry, boasting the world's top market share in flying probe testers. After developing the world's first flying probe tester in 1987, it was showcased at a technology exhibition in Germany in 1988. It received high praise from the local electronics industry, which led to the start of its expansion into the European market. In 1990, sales began in the United States, another industrially advanced country. In 1995, it was awarded the "TEST INNOVATION OF THE YEAR," a prize given to the most innovative inspection machines, further recognizing its performance worldwide. Currently, Takaya has established sales and service bases in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. To meet the high demands from various manufacturers, new models and groundbreaking features are continuously being added, and the sales network continues to expand. If you have any issues with electrical testing of PCBs, please feel free to contact Takaya.

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Fastest in-circuit testing! Case studies of flying probe testers.

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing. Here are some case studies.

■Inspection of mass-produced products By connecting to loaders/unloaders, automated and unmanned inspections are possible even for large lots. ■Inspection of small quantities of various types of substrates There is no need for dedicated jig manufacturing costs. While it is difficult to identify defective areas in function tests, they can be identified through in-circuit tests. ■Inspection of prototype substrates We can respond immediately to design changes. Function tests are also possible, such as applying voltage to the substrate to confirm circuit operation (ON/OFF) and measuring direct current. ■Implementation confirmation inspection during model switching We can reliably and quickly confirm the mounting program of the first lot and check for incorrect component sets on the mounter during model switching. ■Defect analysis inspection This can be used for inspecting substrates that failed functional tests or for defect analysis of substrates that failed in the market. It significantly reduces repair time and decreases the number of discarded substrates. Additionally, there are various other applications where Takaya testers have been utilized successfully. For more details, please contact your sales representative.

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Collaboration with boundary scan testing using a flying probe tester.

We will create new value through the mutual complementarity of ICT and BST.

In-circuit testing with a flying probe tester excels at inspecting the electrical characteristics of implemented electronic components in analog circuits. However, components that cannot be probed make electrical testing difficult, and functional testing of digital circuits is challenging. On the other hand, boundary scan testing allows for quick interconnection testing between LSI pins and on-board programming for FPGAs, but it can only test digital circuits around ICs that comply with the boundary scan standard, and it also requires specialized fixtures for connections. At Takaya Corporation, we possess technology that uses flying probes instead of fixtures to connect 4 to 5 scan-compatible pins and measuring instruments required for boundary scan testing. This allows for boundary scan testing even when the counterpart of a boundary scan-compliant IC is a non-boundary scan-compliant IC or passive components (such as connectors) by enabling the flying probe to function as a virtual boundary scan cell. With a single flying probe tester, it is possible to conduct comprehensive testing of both digital and analog circuits, thereby significantly enhancing testing efficiency compared to before.

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  • Circuit Board Inspection Equipment

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Implementation Technology Journal Electronics Implementation Technology Special Feature Article Published

We have received permission to publish the feature article that was included in the only domestic magazine specializing in implementation technology, "Electronics Implementation Technology." You can view it here.

Special Feature Content ■ Latest Trends in BGA Implementation Board Inspection Hybrid Inspection of Flying Probe Testers and JTAG Testing Andor System Support Co., Ltd. / Masayuki Taniguchi Takaya Co., Ltd. / Kohei Yanagida Overview BGA (Ball Grid Array) components are now used in all types of electronic devices, from consumer products to industrial equipment, and more recently, automotive devices. However, a reliable method for inspecting boards with BGA components (hereafter referred to as BGA implementation boards) has not been established. This is because every inspection method has its advantages and disadvantages, making it impossible to conduct a complete test using only one inspection method. Therefore, inspecting BGA implementation boards has become a challenge for many companies. In this article, we will introduce the latest technological trends in hybrid inspection that combines flying probe testers and JTAG (Joint Test Action Group) boundary scan as one solution to this issue. 1. Introduction 2. Inspection and Challenges of BGA Implementation Boards 3. Possibilities of Electrical Testing 4. In-Circuit Testing 5. JTAG Boundary Scan Testing 6. Hybrid Testing 7. Conclusion

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  • Circuit Board Inspection Equipment

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Introduction to the special feature article of the European electronics industry magazine "EPP"

The European electronics industry magazine "EPP" has published a feature article on Takaya's flying probe tester.

In the October 2023 issue of the European electronics industry magazine "EPP," an article introducing Takaya's flying probe testers has been published. Takaya Corporation and its European distributor, Cystec Europe, have maintained a long-standing partnership with Siemens in Germany. At Siemens' global flagship factory "SIEMENS Karlsruhe," 12 Takaya flying probe testers are currently in operation, ensuring the reliability of assembled circuit boards. The APT-1600FD-A achieves fully unmanned inspection 24 hours a day, 5 days a week through simultaneous inspection of both sides, automatic setup of inspection programs using new software, and automatic transport of circuit boards using an Autonomous Mobile Robot (AMR). Additionally, it supports the latest interface standards such as OPC UA, enabling integration with MES systems, as well as establishing an environment for monitoring operational rates and automatically switching inspection programs based on defect statistics. Please check the related links and download page for more information.

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Low resistance measurement mode (0.1mΩ~) [Under development]

Introducing the Takaya Flying Probe Tester. We are challenging the measurement of low resistance (0.1mΩ and below).

At Takaya, in order to respond to further requests from our customers, we are advancing the development of a unique mode for the flying probe tester that adjusts the application parameters to measure lower resistance (0.1 mΩ and below). *Resolution: 0.001 mΩ Compared to handheld low-resistance meters, the flying probe tester has longer measurement lines (approximately 5 meters) from the measurement probes to the main unit, which necessitates machine design that takes external noise into account; however, we have expertise in this area. Additionally, when measuring with handheld probes, the force, angle, and position when contacting the measurement target are not consistent, which can lead to variations in measurement results and potential marks or damage to the object being measured. Our probe system is well-regarded for its damage-free contact and high-precision contact. If you have concerns such as wanting to eliminate the uncertainty of manual measurements or finding the measurement process too cumbersome, please feel free to reach out to us. We would be happy to accept test trials.

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[Exhibition Information] Introduction of Exhibited Products at the 38th Nepcon Japan

Thank you for visiting the 38th Internepcon Japan Electronics Manufacturing and Assembly Exhibition.

You can view information about the products exhibited on that day here. 〇 Industrial Equipment Division - Flying Probe Tester APT-1600FD-A (Assembly Board Inspection Device) Unmanned continuous inspection linked with front and rear devices OPC-UA (OPC Unified Architecture) Linked with MES (Manufacturing Execution System) Real-time information collection and management of operational status 〇 RF Division / Solutions Division - RFID Outgoing Management System - RFID UHF Band Continuous Monitoring System - Work performance collection using RFID / Semiconductor IC Tag Reading - RFID × IoT Data Device "RFID Performance Collection System" - Easy replacement from barcode HID reader and key input tool

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38th Electronics Packaging Society Spring Conference Presentation Materials Released

The presentation materials for the 38th Electronics Packaging Society Spring Conference are now available.

The 38th Electronics Packaging Society Spring Conference was held from March 13 (Wednesday) to 15 (Friday), 2024, at the Noda Campus of Tokyo University of Science. At this conference, Mr. Yanagida, the Technical Department Manager of Takaya Corporation's Industrial Equipment Division, gave a presentation on "The Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers." The presentation materials from that session have been made available, so please take a look at the related catalog pages below. -------- Content -------- To ensure reliable assembly guarantees for printed circuit boards, electrical testing is essential. However, a single testing method alone does not provide sufficient test coverage. To address this issue, we introduce a hybrid testing system that integrates flying probe testers with JTAG boundary scan testing. By complementing each testing method, we can maximize the test coverage for high-density printed circuit boards, enabling more accurate fault diagnosis.

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Dual Side Flying Probe Tester APT-2600FD

A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!

The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototyping to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.*

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